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Chin. Opt. Lett.
 Home  List of Issues    Issue 07 , Vol. 01 , 2003    Measurement of the wavelength modulation indices with selective reflection spectroscopy


Measurement of the wavelength modulation indices with selective reflection spectroscopy
Liantuan Xiao1;2, Jianming Zhao1, Wangbao Yin1, Yanting Zhao1, Bernard Journet2, Suotang Jia1
1State Key Lab of Quantum Optics and Quantum Devices, Department of Electronics & Information Technology, Shanxi University, Taiyuan 0300062SATIE Lab, Ecole Normale Sup′erieure de Cachan, 61 Avenue du President Wilson 94230 Cachan, France

Chin. Opt. Lett., 2003, 01(07): pp.426-426-

DOI:
Topic:Quantum optics
Keywords(OCIS Code): 300.6380  300.6260  300.6210  300.3700  

Abstract
The wavelength modulation indices are measured based on harmonic amplitude ratio of 4f_(amp)/6f_(amp) (4f_(amp) and 6f_(amp) are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S_(1/2)(F = 4) → 6P_(3/2)(F' = 5) transition of cesium D_(2) line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly.

Copyright: © 2003-2012 . This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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Received:2002/12/31
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Get Citation: Liantuan Xiao, Jianming Zhao, Wangbao Yin, Yanting Zhao, Bernard Journet, Suotang Jia, "Measurement of the wavelength modulation indices with selective reflection spectroscopy," Chin. Opt. Lett. 01(07), 426-426-(2003)

Note: This work was supported in part by the National Natural Science Foundation of China (Grant No. 10174047, 60078009) and the Natural Science Foundation of Shanxi Province. B. Journet’s e-mail address is journet@satie.ens-cachan.fr. L. Xiao’s e-mail address is xlt@sxu.edu.cn.



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