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Chin. Opt. Lett.
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Study for infrared spectroscopic ellipsometric properties of diamond films      PDF
  • Chin. Opt. Lett., 2004, 02(05): pp.308-308-
  • Linjun Wang, Yiben Xia, Hujiang Shen, Minglong Zhang, Ying Yang, Lin Wang
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    Characterization of planar photonic crystals using surface coupling techniques at large wavelengths      PDF
  • Chin. Opt. Lett., 2007, 05(09): pp.501-503-3
  • Y. Benachour, N. Paraire
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    In situ ellipsometric monitoring of complex multilayer designs      PDF
  • Chin. Opt. Lett., 2010, 08(s1): pp.44-48-5
  • Svetlana Dligatch
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    Polarimetric interferometer for measuring nonlinearity error of heterodyne interferometric displacement system      PDF
  • Chin. Opt. Lett., 2013, 11(06): pp.061201
  • Su’an Xu, Luc Chassagne, Suat Topcu, Le Chen, Jian Sun, Tianhong Yan
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    A three-spectrum method for accurate calibration of bi-plate zero-order retarder      PDF
  • Chin. Opt. Lett., 2014, 12(03): pp.031202
  • Zhigang Han, Zhi Xu, Lei Chen
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    Real-time observation of liquid crystal molecular directions based on a snapshot polarimeter      PDF
  • Chin. Opt. Lett., 2017, 15(06): pp.061601
  • Jing Ma, Canhua Xu, and Yangguang Yao
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    Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-emitting diodes application      PDF
  • Chin. Opt. Lett., 2017, 15(11): pp.111602
  • Fan Zhang, Cong Wang, Kai Yin, Xinran Dong, Yuxin Song, Yaxiang Tian, and Ji’an Duan
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    Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view      PDF
  • Chin. Opt. Lett., 2019, 17(01): pp.011201
  • Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, and Huijie Huang
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