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Chin. Opt. Lett.
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Study for infrared spectroscopic ellipsometric properties of diamond films      PDF
  • Chin. Opt. Lett., 2004, 02(05): pp.308-308-
  • Linjun Wang, Yiben Xia, Hujiang Shen, Minglong Zhang, Ying Yang, Lin Wang
    Characterization of planar photonic crystals using surface coupling techniques at large wavelengths      PDF
  • Chin. Opt. Lett., 2007, 05(09): pp.501-503-3
  • Y. Benachour, N. Paraire
    In situ ellipsometric monitoring of complex multilayer designs      PDF
  • Chin. Opt. Lett., 2010, 08(s1): pp.44-48-5
  • Svetlana Dligatch
    Polarimetric interferometer for measuring nonlinearity error of heterodyne interferometric displacement system      PDF
  • Chin. Opt. Lett., 2013, 11(06): pp.061201
  • Su’an Xu, Luc Chassagne, Suat Topcu, Le Chen, Jian Sun, Tianhong Yan
    A three-spectrum method for accurate calibration of bi-plate zero-order retarder      PDF
  • Chin. Opt. Lett., 2014, 12(03): pp.031202
  • Zhigang Han, Zhi Xu, Lei Chen
    Real-time observation of liquid crystal molecular directions based on a snapshot polarimeter      PDF
  • Chin. Opt. Lett., 2017, 15(06): pp.061601
  • Jing Ma, Canhua Xu, and Yangguang Yao
    Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-emitting diodes application      PDF
  • Chin. Opt. Lett., 2017, 15(11): pp.111602
  • Fan Zhang, Cong Wang, Kai Yin, Xinran Dong, Yuxin Song, Yaxiang Tian, and Ji’an Duan
    Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view      PDF
  • Chin. Opt. Lett., 2019, 17(01): pp.011201
  • Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, and Huijie Huang
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