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Chin. Opt. Lett.
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Compact liquid-refractive index measuring equipment      PDF
  • Chin. Opt. Lett., 2003, 01(05): pp.278-278-
  • Hong’an Ye, Xi Wang, Cun Chang
    Study on the noise from multiple reflections in the high power attenuation system      PDF
  • Chin. Opt. Lett., 2007, 05(S1): pp.29-32-4
  • Xiaoyan Li, Jianqiang Zhu
    Interaction of circularly polarized pulse with solid target      PDF
  • Chin. Opt. Lett., 2007, 05(S1): pp.172-175-4
  • Xiaomei Zhang, Baifei Shen, Yu Cang, Xuemei Li, Zhangying Jin, Fengchao Wang
    Interface roughness, surface roughness and soft X-ray reflectivity of Mo/Si multilayers with different layer number      PDF
  • Chin. Opt. Lett., 2007, 05(05): pp.301-303-3
  • Junling Qin, Jianda Shao, Kui Yi, Zhengxiu Fan
    Analysis of the positive or negative lateral shift of the reflected beam in Otto configuration under grazing incidence      PDF
  • Chin. Opt. Lett., 2008, 06(06): pp.446-448-3
  • Haichun Zhou, Chunfang Li, Xi Chen
    Measurement of bidirectional reflection distribution function on material surface      PDF
  • Chin. Opt. Lett., 2009, 07(01): pp.88-91-4
  • Wei Zhang, Hongyuan Wang, Zhile Wang
    Optical feedback cavity ring-down technique for high reflectivity measurement      PDF
  • Chin. Opt. Lett., 2010, 08(s1): pp.94-98-5
  • Bincheng Li, Zhechao Qu, Yanling Han, Lifeng Gao, Linghui Li
    Light propagation and re°ection-refraction event in absorbing media      PDF
  • Chin. Opt. Lett., 2010, 08(01): pp.111-114-4
  • Jianqi Shen, Haitao Yu, Jindeng Lu
    Non-scanning, non-interferometric, three-dimensional optical prof ilometer with nanometer resolution      PDF
  • Chin. Opt. Lett., 2011, 09(10): pp.101202
  • Chen-Tai Tan, Yuan-Sheng Chan, Jhao-An Chen, Teh-Chao Liao, Ming-Hung Chiu
    Uncertainty analysis of a pavement reflectance measurement system based on a gonio-photometer      PDF
  • Chin. Opt. Lett., 2014, 12(05): pp.051201
  • Shenglong Fan, Muqing Liu, Haiping Shen
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